Tessent layout-aware Diagnose

流程：

set_context patterns -scan_diagnosis

set_diagnosis_options -MAX_suspects 500

read_flat_model  /pcie/ATPG/20231009/dc_test/chip.flat.gz

create_layout   pcie.layout_aware.ldb -replace \

                        -def /pr/pcie/output/pcie.def.gz  \

                        -lef  /process/tsmc/tcbn12ffcllbwp20p90cpd.lef \

                               /process/tsmc/tcbn12ffcllbwp20p90cpdlvt.lef \

                              /process/tsmc/tcbn12ffcllbwp20p90cpdulvt.lef \

                              /process/tsmc/PLLTS12FFCLVDESKEWD.lef \

                              /process/tsmc/ts6n12ffcllsvta128x68m1sbs_130a_m4xdh.lef \

                              /process/tsmc/ndrm2.lef \                                                                       /process/tsmc/PRTF_Innovus_N12_13M_2Xa1Xd3Xe2Y2Yy2R_UTRDL_H576_CPODE.12a.tlef \

                             

report_lyaout_rules -mismatch_report > ../data/pcie.layout_aware.mismatch.rpt

open_layout ./pcie.layout_aware.ldb

read_patterns  /pcie/ATPG/20231009/dc_test/chip_scan_test.para.stil

diagnose_failures  /debug/pcie/failog/pcie_scan_faillog.tst  \

-output ../data/diagnose_out/pcie_scan_test.fail_analys.layout_aware.diag.rpt

write_diagnosis -format text layout -file ./results/file1 -replace

在terminal终端开始运行：tessent -shell -dofile ../scr/tessent.layout_aware.diagnose.tcl -log ../data/diagnose_out/pcie_scan_test.diag.log -replace