使用不同的算法配置 Tessent Memory BIST Controller

Diverse Ways To use Algorithms With Programmable Controllers in Tessent Memory BIST

As part of the Tessent Memory BIST solution, Siemens provides a library of test patterns or algorithms for testing your memories. These algorithms represent some of the tests that you can perform on your memories using a Tessent Memory BIST Programmable controller.

To understand the spectrum of these algorithms better, we shall discuss the default algorithm, additional Tessent Library algorithms and custom algorithms (more commonly called user-defined algorithms).

The default algorithm is the algorithm the tool will see in and select from the memory library file. The file is received from the memory vendor and by default, the Tessent Memory BIST controller would only include whichever algorithm that is described in it. Depending