缩小差距：Tessent CellModelGen如何提高半导体测试精度

Closing the Gap: How Tessent CellModelGen Elevates Semiconductor Test Accuracy

In today’s semiconductor manufacturing, the pursuit of perfection leaves no room for error. Traditional testing methodologies often miss subtle yet critical cell-level defects. Tessent’s CellModelGen tool revolutionizes this landscape by providing a fully automated, highly precise method of generating cell-aware ATPG models. By operating directly at the transistor level, it identifies potential issues that earlier methods overlooked, ensuring superior defect coverage across integrated circuit designs.

The effectiveness of Tessent CellModelGen comes from its methodical, four-step characterization flow—layout extraction, defect analysis, analog fault simulation, and finally cell synthesis. Initially, it extracts detailed transistor-level netlists alon