DFT实训教程笔记4（bibili版本）- ATPG

本博文是博主记录DFT实训教程的笔记版本，此笔记并没有对所有的知识进行记录，仅仅以自身的认知水平，来记录了一些部分笔记并加上了自己的理解。

Physical Defects

short and open
transistor short and transistor open
DRC escape
具有多样性和复杂性的特点

Fault model

Fault model 建立数学模型 - abstraction of defect behaviour

Fault models represent diversity of VLSI defects
they should accurately reflect the behavior of defectsthey should be tractable
能够精确反应fault模型，并且能求解，易求解的才会被用于实际。

uses of fault models:
test generation
fault simulation
quality prediction
fault diagnosis

stuck at fault model 是最经典的fault model

Delay Fault Model

delay fault model：gate delay fault -input or output of a gate has a slow 0 to 1 or 1 to 0 transition. delay fault 又分为了下面两种：

1、gross gate delay -greater than system clock period(Transition Delay Faults)
因为某一个