Understanding Single-Ended, Pseudo-Differential and Fully-Differential ADC Inputs


© Jun 14, 2002, Maxim Integrated Products, Inc.

Abstract: Many of today's instrumentation and process control applications convert the analog output of a sensor for processing and/or storage using an analog-to-digital converter (ADC). For voltage input ADCs, three different input structure types exist: Single-Ended, Pseudo-Differential and Fully-Differential. This tutorial explains the differences, advantages and tradeoffs between the input types. 

Many of today's electronic instruments rely on microcontrollers or digital signal processors (DSPs) to process real world, analog signals. Sensors convert a natural parameter, such as temperature or pressure, into a voltage or current. Analog-to-digital converters (ADCs, or A/D converters) convert the signal into digital form.

For voltage input ADCs, three different input structure types exist: Single-Ended, Pseudo-Differential and Fully-Differential.

The simplest solution is to select an ADC input structure that matches the sensor output. However, there are trade-offs with each structure that should be considered. In addition, if signal-conditioning circuitry is used between the sensor and the ADC, this circuitry can affect the ADC input structure choice. Some ADCs are configurable, allowing selection between single-ended or pseudo-differential input structures (MAX186, MAX147) while others allow a choice between single-ended or fully-differential (MAX1298, MAX1286). 

Fully-Differential Inputs

For maximum noise rejection, use fully-differential inputs. Figure 1 shows an example of a fully-differential ADC T/H input structure. During track mode, Csample(+) charges to [AIN(+) Ð VDD/2] and Csample(-) charges to [AIN(-) Ð VDD/2]. When the T/H switches to hold mode, Csample(+) and Csample(-) connect together in series, such that the voltage sample presented to the ADC is the difference of AIN(+) and AIN(-). The differential architecture in conjunction with acceptable input bandwidth in the T/H are key ingredients for good dynamic common-mode rejection. 

Figure 1. Fully-differential T/H stage.
Figure 1. Fully-differential T/H stage.

In noisy environments, it is possible that coupled-noise could cause the differential inputs to exceed the ADC's allowable input voltage range. For best performance, reduce the input signal range to ensure that the ADC input range is not exceeded.

Another key advantage of differential signals is the increased dynamic range. With power supplies dropping to 3.3V and lower, design engineers are looking for ways to achieve greater input dynamic range. In theory, given the same voltage range for single-ended and fully-differential inputs, the fully-differential inputs will have double the dynamic range (Figure 2). This is because the two differential inputs can be 180° out of phase, as shown inFigure 3.

Figure 2. Fully-differential mode - AIN(+) and AIN(-) - 180° out of phase.
Figure 2. Fully-differential mode - AIN(+) and AIN(-) - 180° out of phase.

Figure 3. Fully-differential modes vs. single-ended is doubling ADC dynamic range.
Figure 3. Fully-differential modes vs. single-ended is doubling ADC dynamic range.

Another way to think about this is in relation to signal-to-noise ratio (SNR). The SNR is defined in terms of the ADC's full-scale input level and the minimum detectable signal:
 
The minimum detectable signal is typically limited by the noise floor. Since fully-differential inputs have 2 times the full-scale input voltage level and have superior DC and AC common-mode rejection (which manifest themselves as noise), SNR increases.

Floating Differential Inputs

Ideally, common-mode voltages beyond GND and VDD can exist in a differential system, provided that the differential voltage does not exceed the ADC input range. In practice, this is achievable only if the sensor and the ADC are isolated. In Figure 4's example, the voltages at AIN(+) and AIN(-) fall within the input range specified by the ADC, but a large common-mode voltage on the sensor output voltage forces the ADC inputs to exceed the maximum input voltage specification.

Figure 4. High common-mode voltage.
Figure 4. High common-mode voltage.

Figure 5 shows the same system, but using a separate power supply with galvanically isolated grounds. RBias biases the inputs to VREF/2 to minimize drift due to leakage currents. As long as isolation between the grounds exists, the ADC only sees the differential voltage between AIN(+) and AIN(-), thus the transducer (or ADC) is referred to as "floating". (Note: To ensure galvanic isolation, all leakage paths between the transducer ground and system ground must be considered. A battery-powered system inherently provides isolation, provided its chassis is isolated from its internal ADC system ground).

Figure 5. High common-mode voltage with a separate system power supply.
Figure 5. High common-mode voltage with a separate system power supply.

Pseudo-Differential Inputs

Pseudo-differential inputs are similar to fully-differential inputs in that they separate signal ground from the ADC ground, allowing DC common-mode voltages to be canceled (unlike single-ended inputs). However, unlike fully-differential inputs, they have little effect on dynamic common-mode noise. 

In Figure 6, sampling only occurs on the input AIN(+) signal. The signal common, AIN(-), is not sampled. During the 'TRACK' mode, the sampling capacitor charges through the series resistor RON. During the 'HOLD' mode, the sampling capacitor connects to AIN(-) and an inverted input signal is presented to the ADC for conversion. Because sampling only occurs on the AIN(+) input, AIN(-) must remain within ±0.1LSB during the conversion for optimal performance.

Figure 6. Pseudo-differential T/H stage.
Figure 6. Pseudo-differential T/H stage.

An alternate method of implementing pseudo-differential inputs samples AIN(+) and AIN(-) sequentially, and the difference of the two voltages is provided as the conversion result. 

For dynamic signals, the phase of AIN(+) and AIN(-) will not match during sampling resulting in distortion. Select an ADC with fully-differential inputs for dynamic time-varying signals. 

A typical application for pseudo-differential inputs is measuring sensors that are biased to an arbitrary DC level. Some parts, like the MAX146, have a COM pin that allows single-ended inputs referenced to the common-mode voltage, making it pseudo-differential. All input channels are referenced to the COM voltage. 

Figure 7 shows a thermistor connected in a Wheatstone-bridge application. In this example, AIN(+) and AIN(-) are both non-zero. The output code of the ADC will be a function of the differential voltage, AIN(+) - AIN(-). The pseudo-differential inputs cancel out the DC common-mode voltage. To ensure AIN(-) is stable to within ±0.1LSB, bypass AIN(-) to analog ground with a 0.1µF capacitor.

Figure 7. Wheatstone bridge application.
Figure 7. Wheatstone bridge application.

Single-Ended Inputs

Single-ended inputs are generally sufficient for most applications. In single-ended applications, all signals are referenced to a common ground at the ADC. Each channel uses a single input pin. The analog ground pin is shared between all inputs for multi-channel systems. DC offset and/or noise in the signal path will decrease the dynamic range of the input signal. Single-ended inputs are ideal if the signal source and ADC are close to each other (i.e., on the same board so that signal traces can be kept as short as possible). Single-ended inputs are more susceptible to coupled-noise and DC offsets. However, signal conditioning circuitry can reduce these effects. 

Figure 8 shows a simplified example of a track-and-hold (T/H) input of a single-ended ADC. The sampling capacitor is switched to the input pin through a series resistance during the 'TRACK' mode. The switch opens when the T/H enters 'HOLD' mode (during the actual conversion process) and the ADC converts the voltage across the sampling capacitor into a digital code.

Figure 8. Single-ended T/H stage.
Figure 8. Single-ended T/H stage.

Common-Mode Voltage and Common-Mode Rejection Ratios

Common-mode voltage refers to a common voltage (i.e., with the same magnitude and phase that appears on both differential inputs (Figure 9)). Common-mode rejection ratio (CMRR) is often specified for fully-differential inputs and describes the ADCs ability to reject a common-mode (typically DC) voltage. A DC common-mode voltage appearing across an ADC input has the same effect as a DC input offset. Normally, the sensor signal and ground wire are in close proximity physically and will couple in common-mode noise. The largest source of common-mode noise is often 50/60Hz noise from power lines. Power supply ripple, EMF, RF or high-frequency switching noise can also be sources of common-mode noise.

Figure 9. Common-mode voltage.
Figure 9. Common-mode voltage.

Common-mode rejection ratio (CMRR) is generally defined as the ratio between the differential voltage gain versus the common-mode voltage gain:
 
Where:

ADIFF = differential voltage gain 
ACM = common-mode voltage gain

For ADCs, the differential voltage gain (ADIFF) is defined as ΔOutput_Code/ΔDifferential_Voltage and the common-mode voltage gain is defined as ΔOutput_Code/ΔCommon_Mode_Voltage. For fully-differential inputs, output code change will be small with respect to the common-mode voltage; therefore the CMRR will be large and is often expressed on a logarithmic scale.

It is important to note that CMRR is a dependant on frequency-dependent parameter. As the frequency of the common-mode voltage increases, the phase matching between AIN(+) and AIN(-) for optimal common-mode rejection becomes more difficult to sustain. As a result, common-mode rejection is less effective at high frequencies.

Summary

Interfacing a sensor to an ADC requires matching the sensor/signal conditioning output with the ADC input. Voltage output sensors provide either a single-ended or differential output. For single-end signals, all the inputs are referenced to system ground. Differential signals provide a positive and a negative signal with the positive output (AIN+) referenced to the negative output (AIN-). 

Three common ADC input structures accommodate single-ended or differential output sensors: single-ended, pseudo-differential or fully-differential. The simplest method is to use a single-ended ADC when measuring single-ended signals. If a differential ADC is used to measure single-ended signals, simply connect the ADC AIN(-) pin to analog ground. This allows both single-ended and differential signals to be measured using a multi-channel differential input ADC. 

Differential inputs can offer a performance improvement over single-ended inputs by measuring the difference in voltage between the positive and negative terminals of the sensor. This provides common mode rejection. Choose pseudo-differential ADCs for DC common-mode voltage rejection. For sensors requiring excitation, using pseudo-differential ADCs can zero out the bias voltages and allow the sensor ground to be different then the analog ground. Pseudo-differential inputs do not provide AC common-mode rejection. For dynamic common-mode rejection, choose fully-differential ADCs. Fully-differential inputs offer the best performance by rejecting DC and dynamic common-mode voltages. The final choice of which input structure to use will depend on the sensor, the signal conditioning circuitry, the application and the accuracy requirement. 
<think>好的,用户之前问的是关于STM32 ADC通道的两个模式,我之前回答了规则组和注入组。但现在用户澄清说,他们实际想问的是单端(single-end)和差分(differential)模式。我需要调整方向,专注于这两种输入模式的区别和应用。 首先,我应该确认用户的需求。他们可能在配置ADC时遇到了这两种模式的选择问题,或者在阅读数据手册时遇到了这两个术语。需要解释这两种模式的基本概念、工作原理、优缺点以及适用场景。 接下来,要确保内容结构清晰,便于用户理解。可能需要分点说明,对比两者的差异,并给出实际应用的例子。同时,要注意使用中文,避免专业术语过于复杂,必要时用比喻帮助理解。 需要检查是否有技术细节上的错误,比如单端输入的参考地,差分输入的信号范围计算,共模电压的概念是否正确。还要考虑用户可能的后续问题,比如如何配置STM32的ADC为这两种模式,或者如何选择适合的模式,是否需要加入配置代码示例? 另外,用户可能对噪声抑制和信号测量精度感兴趣,所以需要强调差分模式在抗噪声方面的优势,以及单端模式的简单性。同时,可能需要提到输入电压范围,例如在STM32中,单端模式的输入通常是0到Vref,而差分模式则是正负电压范围,但具体取决于参考电压的设置。 还要注意用户可能混淆的其他概念,比如规则组和注入组与输入模式的区别,但用户已经明确问题,所以应专注于当前主题。最后,总结部分需要简明扼要,帮助用户根据实际需求做出选择。</think>在STM32的ADC配置中,**单端模式(Single-Ended)**和**差分模式(Differential)**是两种不同的信号输入方式,用于处理模拟信号的采集。它们的核心区别在于信号参考点和抗干扰能力。以下是详细解释: --- ### **一、单端模式(Single-Ended)** #### 1. **定义** - 单端模式以**公共地(GND)**为参考点,直接测量**单个引脚(如ADCx_INn)**对地的电压值。 - 公式表示: $$ V_{\text{测量值}} = V_{\text{信号引脚}} - V_{\text{GND}} $$ #### 2. **特点** - **简单易用**:仅需一根信号线,硬件设计简单。 - **易受干扰**:若信号线较长或环境噪声大,测量值可能包含共模噪声。 - **输入范围**:通常为 **0 ~ V_{REF+}**(例如0~3.3V)。 #### 3. **应用场景** - 传感器输出信号直接接地(如电位器、光敏电阻)。 - 低噪声环境下的短距离信号采集。 #### 4. **STM32配置示例** ```c ADC_ChannelConfTypeDef sConfig = {0}; sConfig.Channel = ADC_CHANNEL_5; // 选择通道5(单端输入) sConfig.Rank = ADC_REGULAR_RANK_1; // 规则组序列 sConfig.SamplingTime = ADC_SAMPLETIME_480CYCLES; HAL_ADC_ConfigChannel(&hadc1, &sConfig); ``` --- ### **二、差分模式(Differential)** #### 1. **定义** - 差分模式通过**两个引脚(如ADCx_INn和ADCx_INm)**测量电压差,抑制共模噪声。 - 公式表示: $$ V_{\text{测量值}} = (V_{\text{正输入引脚}} - V_{\text{负输入引脚}}) \times \text{增益} $$ #### 2. **特点** - **高抗干扰性**:抵消共模噪声(如电源噪声、环境电磁干扰)。 - **输入范围**:支持**正负电压测量**(例如±1.5V,取决于参考电压和PGA配置)。 - **硬件复杂度**:需两个信号引脚,可能需外部匹配电阻。 #### 3. **应用场景** - 高噪声环境(如电机控制、工业现场)。 - 小信号放大(如热电偶、电桥传感器)。 #### 4. **STM32配置示例** ```c ADC_ChannelConfTypeDef sConfig = {0}; sConfig.Channel = ADC_CHANNEL_5 | ADC_DIFFERENTIAL_MODE; // 通道5为差分正输入 sConfig.Rank = ADC_REGULAR_RANK_1; sConfig.SamplingTime = ADC_SAMPLETIME_480CYCLES; sConfig.DifferentialMode = ENABLE; // 使能差分模式 sConfig.OffsetNumber = ADC_OFFSET_NONE; // 可选:偏移校准 HAL_ADC_ConfigChannel(&hadc1, &sConfig); ``` --- ### **三、核心区别对比** | **特性** | **单端模式** | **差分模式** | |--------------------|------------------------------|------------------------------| | **信号参考点** | 以GND为参考 | 以另一引脚为参考 | | **抗干扰能力** | 弱 | 强(抑制共模噪声) | | **输入范围** | 0 ~ V_{REF+} | 可正负(如±V_{REF}/2) | | **硬件复杂度** | 简单(单线) | 复杂(双线+阻抗匹配) | | **适用场景** | 低噪声、简单信号 | 高噪声、小信号或长距离传输 | --- ### **四、如何选择模式?** 1. **选择单端模式**: - 信号幅度较大(接近V_{REF}范围)。 - 信号源与ADC共地且距离短。 - 对成本敏感,需减少硬件复杂度。 2. **选择差分模式**: - 信号微弱(如mV级)。 - 信号源与ADC地之间存在电位差(如远程传感器)。 - 环境噪声大(如电机、开关电源附近)。 --- ### **五、关键注意事项** 1. **共模电压范围**: 差分模式下,需确保 $$ V_{\text{正输入}} $$ 和 $$ V_{\text{负输入}} $$ 的**共模电压**(即平均值)在ADC允许范围内(见数据手册)。 2. **增益配置**: 部分STM32型号支持可编程增益放大器(PGA),可放大差分信号(例如x2, x4, x8),但会牺牲输入范围。 3. **校准**: 差分模式可能需额外校准偏移误差(通过`HAL_ADCEx_Calibration_SetValue`)。 --- ### **六、典型应用电路** #### 1. **单端模式电路** ``` Sensor → ADC_INn │ GND ``` #### 2. **差分模式电路** ``` Sensor+ → ADC_INn Sensor-ADC_INm │ GND(可选) ``` --- **总结**: - **单端模式**适合简单、低成本的信号采集,但对噪声敏感。 - **差分模式**通过硬件设计提升信噪比,适合高精度或恶劣环境。 实际项目中,可根据信号特性、环境噪声和硬件资源灵活选择。
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