|
Abbreviated terms |
Terms |
中文直译 |
|---|---|---|
| ACC | Adaptive Cruise Control | 自适应巡航控制 |
|
ADC |
Analogue to Digital Converter |
模拟数字转换器 |
|
AEC |
Automotive Electronics Council |
汽车电子委员会 |
|
AIS |
Abbreviated Injury Scale |
简化的伤害定级 |
|
ALU |
Arithmetic Logic Unit |
算术逻辑单元 |
|
ASIC |
Application-Specific Integrated Circuit |
专用集成电路 |
|
ASIL |
Automotive Safety Integrity Level |
汽车安全完整性等级 |
|
BB |
Body Builder |
车身制造厂 |
|
BFR |
Base Failure Rate |
基本故障率 |
|
BIST |
Built-In Self-Test |
内置自检 |
|
CAN |
Controller Area Network |
控制器局域网 |
|
CCF |
Common Cause Failure |
共因故障 |
|
CCP |
Controllability Classification Panel |
可控性分类面板 |
|
CMOS |
Complementary Metal Oxide Semiconductor |
互补金属氧化物半导体 |
|
COTS |
Commercial Off The Shelf |
商业现货 |
|
CPU |
Central Processing Unit |
中央处理器 |
|
CRC |
Cyclic Redundancy Check |
循环冗余校验 |
|
DC |
Diagnostic Coverage |
诊断覆盖度 |
|
DAC |
Digital to Analogue Converter |
数模转换器 |
|
DFA |
Dependent Failure Analysis |
相关性失效分析 |
|
DFI |
Dependent Failure Initiator |
相关故障发起者 |
|
DIA |
Development Interface Agreement |
开发接口协议 |
|
DMA |
Direct Memory Access |
直接内存访问 |
|
DMOS |
Double diffused Metal Oxide Semiconductor (HV MOS) |
双扩散金属氧化物半导体 |
|
DSP |
Digital Signal Processor |
数字信号处理器 |
|
ECC |
Error Correction Code |
错误纠正码 |
|
ECU |
Electronic Control Unit |
电子控制单元 |
|
EDC |
Error Detection Code |
错误检测代码 |
|
E/E system |
Electrical and/or Electronic system |
电气电子系统 |
|
EEC |
Evaluation of Each Cause of safety goal violation |
评估违反安全目标原因 |
|
EMC |
ElectroMagnetic Compatibility |
电磁兼容 |
|
EMI |
ElectroMagnetic Interference |
电磁干扰 |
|
EOTI |
Emergency Operation Time Interval |
紧急操作时间间隔 |
|
EOTTI |
Emergency Operation Tolerance Time Interval |
紧急操作容许时间间隔 |
|
ESD |
ElectroStatic Discharge |
静电放电 |
|
ESC |
Electronic Stability Control |
电子稳定控制 |
|
ETA |
Event Tree Analysis |
事件树分析 |
|
EVR |
Embedded Voltage Regulator |
嵌入式稳压器 |
|
FDTI |
Fault Detection Time Interval |
嵌入式稳压器 |
|
FET |
Field Effect Transistor |
场效应晶体管 |
|
FHTI |
Fault Handling Time Interval |
故障处理时间间隔 |
|
FIT |
Failures In Time (in this standard a FIT is 10E-9 failures per operational hour) |
失效率 |
|
FMC |
Failure Mode Coverage |
故障模式覆盖度 |
|
FMEA |
Failure Mode and Effects Analysis |
失效模式及影响分析 |
|
FPGA |
Field Programmable Gate Array |
现场可编程门阵列 |
|
FRTI |
Fault Reaction Time Interval |
故障反应时间间隔 |
|
FTA |
Fault Tree Analysis |
故障树分析 |
|
FTTI |
Fault Tolerant Time Interval |
容错时间间隔 |
|
GPU |
Graphics Processing Unit |
图形处理单元 |
|
HARA |
Hazard Analysis and Risk Assessment |
危害分析和风险评估 |
|
HAZOP |
HAZard and OPerability analysis |
危害与可操作性分析 |
|
HSI |
Hardware-Software Interface |
硬件-软件接口 |
|
HS/LS |
High Side / Low Side |
高边/低边 |
|
HW |
HardWare |
硬件 |
|
IC |
Integrated Circuit |
集成电路 |
|
I/O |
Input – Output |
输入/输出 |
|
ISA |
Instruction Set Architecture |
指令集架构 |
|
LDO |
Low Drop Output regulator |
低压降输出稳压器 |
|
LFM |
Latent-Fault Metric |
潜伏故障度量 |
|
LS |
Low Side |
低边 |
|
LSB |
Least Significant Bit |
最低有效位 |
|
MBD |
Model Based Development |
基于模型的开发 |
|
MC/DC |
Modified Condition/Decision Coverage |
修改条件/决策覆盖 |
|
MCU |
Multi-point Control Unit |
多点控制器 |
|
MMU |
Memory Management Unit |
内存管理单元 |
|
MPU |
Memory Protection Unit |
内存保护单元 |
|
MSIL |
Motorcycle Safety Integrity Level |
摩托车安全完整性等级 |
|
MUX |
MUltipleXer |
数据选择器 |
|
OEM |
Original Equipment Manufacturer |
原始设备制造商 |
|
OS |
Operating System |
操作系统 |
|
OV |
Over Voltage |
过压 |
|
PAL |
Programmable Array Logic |
可编程阵列逻辑 |
|
PE |
Processing Element |
处理元件 |
|
PLD |
Programmable Logic Device |
可编程逻辑器件 |
|
PLL |
Phase Locked Loop |
锁相环 |
|
PMHF |
Probabilistic Metric for random Hardware Failures |
随机硬件故障的概率度量 |
|
PoF |
Physics of Failure |
物理失效 |
|
PPAP |
Production Part Approval Process |
生产件审批流程 |
|
PTO |
Power Take-Off |
动力输出装置 |
|
QM |
Quality Management |
质量管理 |
|
RAM |
Random Access Memory |
随机内存访问 |
|
RF |
Residual Fault |
残余故障 |
|
RFQ |
Request For Quotation |
询价 |
|
ROM |
Read Only Memory |
只读存储器 |
|
RTL |
Register Transfer Level |
寄存器转换级 |
|
SEB |
Single Event Burnout |
单粒子烧毁 |
|
SEE |
Single Event Effect |
单粒子效应 |
|
SEGR |
Single Event Gate Rupture |
单粒子栅穿 |
|
SEooC |
Safety Element out of Context |
脱离上下文的安全元素 |
|
SET |
Single Event Transient |
单粒子瞬态 |
|
SEU |
Single Event Upset |
单粒子翻转 |
|
SG |
Safety Goal |
安全目标 |
|
SMPS |
Switched Mode Power Supply |
开关电源 |
|
SoC |
System on Chip |
片上系统 |
|
SOP |
Start Of Production |
开始量产 |
|
SPFM |
Single-Point Fault Metric |
单点故障度量 |
|
SPI |
Serial Peripheral Interface |
串行外设接口 |
|
SW |
SoftWare |
软件 |
|
T&B |
Trucks, Buses, trailers and semi-trailers |
卡车,公共汽车,拖车和半拖车 |
|
TCL |
Tool Confidence Level |
工具置信度 |
|
TD |
Tool error Detection |
工具错误检测 |
|
TI |
Tool Impact |
工具影响 |
|
UML |
Unified Modeling Language |
统一建模语言 |
|
UV |
Under Voltage |
欠压 |
|
XML |
eXtensible Markup Language |
可扩展标记语言 |
ISO 26262-1:2018缩略词
于 2022-10-23 15:27:50 首次发布
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