原子力显微镜(atomic force microscope, AFM)

最新推荐文章于 2024-10-26 20:15:48 发布

alice991035

最新推荐文章于 2024-10-26 20:15:48 发布

阅读量1.9k

点赞数

CC 4.0 BY-SA版权

分类专栏： Specialized Courses 文章标签： features include events ibm

本文链接：https://blog.youkuaiyun.com/alice991035/article/details/7060650

原子力显微镜(AFM)是一种高分辨率成像技术，能够真实空间中显示原子级别的细节。它的工作原理是通过保持与表面接触的cantilever尖端的力恒定，扫描表面，记录表面轮廓。AFM适用于导电和非导电表面的成像，广泛应用于生命科学、材料科学、纳米技术等多个领域，提供对分子级别事件的实时观察，有助于深化我们对系统工作原理的理解并推动新发现。

摘要生成于 C知道，由 DeepSeek-R1 满血版支持，前往体验 >

AFM ( Atomic Force Microscopy,Atomic Force Microscopeor SPM (or Scanning ProbeMicroscopy)) isoften called the "Eye of Nanotechnology".

AFM is a high-resolution imaging technique that can resolve features assmall as an atomic lattice in the real space. It allows researchers to observeand manipulate molecular and atomic level features.

How AtomicForce Microscopy works?

AFM works by bringing a cantilever tip in contact with the surface to beimaged. An ionic repulsive force from the surfaceapplied to the tip bends the cantilever upwards. The amount of bending, measured by a laser spot reflected on to asplit photo detector, canbe used to calculate the force. By keeping the force constant whilescanning the tip across the surface, the vertical movement of the tip followsthe surface profileand is recorde