<?xml version="1.0" encoding="utf-8" ?><rss version="2.0"><channel><title><![CDATA[weixin_42123710的博客]]></title><description><![CDATA[]]></description><link>https://blog.youkuaiyun.com/weixin_42123710</link><language>zh-cn</language><generator>https://blog.youkuaiyun.com/</generator><copyright><![CDATA[Copyright &copy; weixin_42123710]]></copyright><item><title><![CDATA[Tessent 指令解析及应用]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/143572491</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/143572491</guid><author>weixin_42123710</author><pubDate>Wed, 06 Nov 2024 16:04:21 +0800</pubDate><description><![CDATA[用于减少aborted faults，当使用此option时，用于存在许多aborted fault但是运行时间显著增加的run。选用此开关时，会增加run time的同时也会增加pattern量，以发掘少数fault点。]]></description><category></category></item><item><title><![CDATA[【EDT专题】浅谈Tessent EDT logic]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/143524858</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/143524858</guid><author>weixin_42123710</author><pubDate>Tue, 05 Nov 2024 23:50:14 +0800</pubDate><description><![CDATA[tessent中关于edt部分介绍]]></description><category></category></item><item><title><![CDATA[有关DFT中灰盒相关]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/135684223</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/135684223</guid><author>weixin_42123710</author><pubDate>Thu, 18 Jan 2024 21:16:56 +0800</pubDate><description><![CDATA[以下是生成灰盒网表的整个过程的描述。当工具处于分析系统模式且设计处于外部模式时，灰盒功能可用。外部模式意味着输入包装器链用于常规测试模式（capture和shift），而输出包装器链仅用于非捕获模式（shift，hold或rotate）。Tessent Scan插入的wrapper chain在外部模式下配置，方法是在移位和捕获阶段将输出包装器链scan_enable信号限制为活动状态。生成灰盒的脚本流程如下：①定义外部模式下使用的时钟引脚（使用add_clocks命令）。]]></description><category></category></item><item><title><![CDATA[【数字IC】hierarchical flow]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129669406</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129669406</guid><author>weixin_42123710</author><pubDate>Mon, 20 Mar 2023 16:20:21 +0800</pubDate><description><![CDATA[随着芯片规模越来越大，传统的flatten flow来design已经无法满足要求。针对规模比较庞大的设计，我们需要将这样的design A进行切分，划分成不同大小或功能的模块的design。然后采用Hierarchy方式对design进行N次逻辑综合，布局布线，寄生参数提取，静态时序分析，物理验证等工作。]]></description><category></category></item><item><title><![CDATA[时钟树综合篇(持续更新)]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129668957</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129668957</guid><author>weixin_42123710</author><pubDate>Mon, 20 Mar 2023 15:53:21 +0800</pubDate><description><![CDATA[详细介绍时钟树相关知识]]></description><category></category></item><item><title><![CDATA[NC-verilog仿真详解(持续更新)]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129459547</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129459547</guid><author>weixin_42123710</author><pubDate>Sat, 11 Mar 2023 11:27:04 +0800</pubDate><description><![CDATA[着实是苦恼啊！找半天找不到NC-verilog仿真好的教程，那么~只能自己动手了！]]></description><category></category></item><item><title><![CDATA[Tessent命令解析]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129374675</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129374675</guid><author>weixin_42123710</author><pubDate>Tue, 07 Mar 2023 08:54:11 +0800</pubDate><description><![CDATA[分享一些常用的DFT指令]]></description><category></category></item><item><title><![CDATA[[2]Planning and Inserting MemoryBIST]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129342354</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129342354</guid><author>weixin_42123710</author><pubDate>Sun, 05 Mar 2023 10:25:51 +0800</pubDate><description><![CDATA[本章的主题涵盖了内存BIST逻辑的规划、创建和后续插入。本章解释了计划步骤，以及如何影响Tessent MemoryBIST工具以提供与预期设计匹配的DFT计划，即DFT规范。它展示了如何通过各种工具功能(包括GUI)审查和进一步编辑这个DftSpecification。最后，本章解释了DftSpecification的验证和后续执行，以使Tessent MemoryBIST生成RTL并将逻辑插入到你的设计中。]]></description><category></category></item><item><title><![CDATA[DFT中文件格式必知必会（持续更新）]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129342581</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129342581</guid><author>weixin_42123710</author><pubDate>Sun, 05 Mar 2023 09:43:15 +0800</pubDate><description><![CDATA[DFT中文件格式必知必会]]></description><category></category></item><item><title><![CDATA[一定要搞懂的建立时间和保持时间]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129174477</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129174477</guid><author>weixin_42123710</author><pubDate>Thu, 23 Feb 2023 15:33:17 +0800</pubDate><description><![CDATA[一定要搞懂的建立时间和保持时间]]></description><category></category></item><item><title><![CDATA[[Mbist Flow]六、Run and Check Test Bench Simulations]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129163319</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129163319</guid><author>weixin_42123710</author><pubDate>Wed, 22 Feb 2023 15:16:40 +0800</pubDate><description><![CDATA[[Mbist Flow]六、Run and Check Test Bench Simulations]]></description><category></category></item><item><title><![CDATA[[Mbist Flow]五、Create Patterns Specification&Process Patterns Specification]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129028819</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129028819</guid><author>weixin_42123710</author><pubDate>Tue, 14 Feb 2023 16:47:53 +0800</pubDate><description><![CDATA[DFT专栏之1.TessentMbist——Flow——Create Patterns Specification&Process Patterns Specification]]></description><category></category></item><item><title><![CDATA[[Mbist Flow]四、Process DFT Specification&Extract ICL]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/129009959</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/129009959</guid><author>weixin_42123710</author><pubDate>Mon, 13 Feb 2023 16:10:38 +0800</pubDate><description><![CDATA[DFT专栏之1.TessentMbist——Flow——Process DFT Specification&Extract ICL]]></description><category></category></item><item><title><![CDATA[[Mbist Flow]三、Create DFT Specification]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/128882599</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/128882599</guid><author>weixin_42123710</author><pubDate>Mon, 13 Feb 2023 15:29:10 +0800</pubDate><description><![CDATA[DFT专栏之1.TessentMbist——Flow——Create DFT Specification]]></description><category></category></item><item><title><![CDATA[DFT中常用英文缩写，词汇及详解（每日持续更新）]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/128837987</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/128837987</guid><author>weixin_42123710</author><pubDate>Wed, 01 Feb 2023 19:24:46 +0800</pubDate><description><![CDATA[对于转行或者刚入行的新人来说，英文缩略词可以说就是前进路上的一道坎，就算是知其然，但也难知其所以然，所以小编只能在边学边总结，希望能帮大家缩短学习周期！]]></description><category></category></item><item><title><![CDATA[[Mbist Flow]一、Design Loading]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/128832457</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/128832457</guid><author>weixin_42123710</author><pubDate>Wed, 01 Feb 2023 16:01:49 +0800</pubDate><description><![CDATA[DFT专栏之1.TessentMbist——Flow——Design Loading]]></description><category></category></item><item><title><![CDATA[[Mbist Flow]二、Specify and Verify DFT Requirements]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/128835578</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/128835578</guid><author>weixin_42123710</author><pubDate>Wed, 01 Feb 2023 16:00:11 +0800</pubDate><description><![CDATA[DFT专栏之1.TessentMbist——flow——Specify and Verify DFT Requirements]]></description><category></category></item><item><title><![CDATA[DFT专栏之1.TessentMbist——Flow and main steps]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/128828965</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/128828965</guid><author>weixin_42123710</author><pubDate>Wed, 01 Feb 2023 11:02:37 +0800</pubDate><description><![CDATA[DFT TessentMbist]]></description><category></category></item><item><title><![CDATA[数字IC验证相关问题（持续更新）]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/124829584</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/124829584</guid><author>weixin_42123710</author><pubDate>Tue, 17 May 2022 20:42:53 +0800</pubDate><description><![CDATA[数字IC流程介绍
转载自网络

]]></description><category></category></item><item><title><![CDATA[三种不同状态机的写法及使用情况分析]]></title><link>https://blog.youkuaiyun.com/weixin_42123710/article/details/124807067</link><guid>https://blog.youkuaiyun.com/weixin_42123710/article/details/124807067</guid><author>weixin_42123710</author><pubDate>Mon, 16 May 2022 20:11:42 +0800</pubDate><description><![CDATA[转载自网络

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