本文提出了一种利用集成电路内部后端电容进行无库、数据库自由的芯片认证方法。该技术简化了认证设置，降低了测试成本，并且由于后端电容对温度和老化变化的不敏感性，比基于晶体管的物理不可克隆函数（PUF）认证更可靠。文中还说明了如何修改模拟数字转换器（ADC）以实现这种认证功能，同时保持其常规功能，避免了对专用认证模块的需求。尽管这种方法增加了3.2%的功率开销和75%的活性面积开销，但鉴于其内在的认证优势，这些额外的成本被认为是值得的。
摘要：
Detection of counterfeit chips has emerged as a crucial concern. Physically unclonable function (PUF)-based techniques are widely used for authentication; however, these require dedicated hardware and large signature database. In this paper, we show intrinsic and database-free authentication using back-end capacitors. The discussed technique simplifies authentication setup and reduces the test cost. We show that an analog-to-digital converter (ADC) can be modified for back-end capacitor-based authentication in addition to its regular functionality; hence, a dedicated authentication module is not necessary. Moreover, since back-end capacitors are quite insensitive to temperature and aging-induced variations than transistors, the discussed technique results in a more reliable authentication than transistor PUF-based authentication. Discussed authentication scheme manifests significant resilience against power supply instability. The modifications to conventional ADC incur 3.2% power overhead and 75% active-area overhead; however, arguably, the advantages of the discussed intrinsic and database-free authentication outweigh the overheads.
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