<?xml version="1.0" encoding="utf-8" ?><rss version="2.0"><channel><title><![CDATA[一棹春风一叶舟，一纶茧缕一轻钩]]></title><description><![CDATA[花满渚，酒满瓯，万顷波中得自由]]></description><link>https://blog.youkuaiyun.com/u014689845</link><language>zh-cn</language><generator>https://blog.youkuaiyun.com/</generator><copyright><![CDATA[Copyright &copy; u014689845]]></copyright><item><title><![CDATA[EVT, DVT, DMT, MVT, PVT, MP解释(转贴)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/132090121</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/132090121</guid><author>u014689845</author><pubDate>Thu, 03 Aug 2023 18:53:42 +0800</pubDate><description><![CDATA[设计者实现样品时做初期的测试验证，包括功能和安规测试，一般由RD(Research&Development)对样品进行全面验证，因是样品，问题可能较多，测试可能会做N次。设计验证测试解决样品在EVT阶段的问题后进行，对所有信号的电平和时序进行测试，完成安规测试，由RD和DQA(Design Qualiy Assurance)验证。PMC: Production & Material Control 生(产)物(料)管(理)]]></description><category></category></item><item><title><![CDATA[Intel 确认 Alder Lake BIOS 的源代码泄露 --------ICE_TEA_BIOS]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/130384745</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/130384745</guid><author>u014689845</author><pubDate>Wed, 26 Apr 2023 14:06:26 +0800</pubDate><description><![CDATA[Alder Lake 是 Intel 2021 年 11 月发布的第 12 代核心处理器。10 月 7 日，有名为 freak 的推特用户在推特上发布了一个链接称是 Intel Alder Lake 的 UEFI 固件。该链接为名为 LCFCASD 的用户发布的 GitHub 库—— ICE_TEA_BIOS。Freak 称 ICE_TEA_BIOS 库中包含 C970 项目的 BIOS 源代码。]]></description><category></category></item><item><title><![CDATA[StressAppTest的简介]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/130315773</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/130315773</guid><author>u014689845</author><pubDate>Sun, 23 Apr 2023 10:20:53 +0800</pubDate><description><![CDATA[StressAppTest的全称是Stressful Application Test (stressapptest) 的简称这里我们可以将其简化为SAT。SAT试图让来自处理器和I/O到内存的数据尽量随机化，以创造出模拟现实的环境来测试现在的硬件设备是否稳定。SAT的大概作用如下：据谷歌的介绍，这个软件会生产线程来拷贝和直接对磁盘进行读取和写入。目标则是尽可能地载入系统内存，以便更加有效地进行测试。该软件更多的时候测试的是内存控制器和总线接口，而不是存储单元的功能。]]></description><category></category></item><item><title><![CDATA[DRAM DDR4&DDR5 UDIMM&RDIMM的内存测试固件开发的经验总结]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/130292158</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/130292158</guid><author>u014689845</author><pubDate>Fri, 21 Apr 2023 16:39:00 +0800</pubDate><description><![CDATA[5.2、报错时，写入报错物理地址的pattern和读出来的实际的pattern，比如写入的pattern是0x55555555，读出来的pattern却是0x15555555；5.2、报错时，写入报错物理地址的pattern和读出的数值，比如写入的pattern是0x55555555，读出来的pattern却是0x15555555；5.3、这个报错的物理地址对应的内存条的卡槽位置、RANK、GROUP、BANK、ROW和COL；]]></description><category></category></item><item><title><![CDATA[How physical addresses map to rows and banks in DRAM]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/102842288</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/102842288</guid><author>u014689845</author><pubDate>Wed, 08 Feb 2023 23:16:19 +0800</pubDate><description><![CDATA[reference:

https://stackoverflow.com/questions/23428690/physical-memory-address-to-dram-mapping-information-for-x86





Here is an example of how 32-bit physical addresses might be mapped*:

Bits ...]]></description><category></category></item><item><title><![CDATA[DRAM内存中1byte的8 bit是否彼此相邻？是否处于同一行的相邻的8列？]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/128838103</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/128838103</guid><author>u014689845</author><pubDate>Wed, 01 Feb 2023 17:51:43 +0800</pubDate><description><![CDATA[MemoryAddressDecode]]></description><category></category></item><item><title><![CDATA[Memory RAS - Reliability, Availability and Serviceability]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/128247982</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/128247982</guid><author>u014689845</author><pubDate>Fri, 09 Dec 2022 10:01:38 +0800</pubDate><description><![CDATA[可靠性。指的是系统必须尽可能的可靠，不会意外的崩溃，重启甚至导致系统物理损坏，这意味着一个具有可靠性的系统必须能够对于某些小的错误能够做到自修复，对于无法自修复的错误也尽可能进行隔离，保障系统其余部分正常运转。可用性。指的是系统必须能够确保尽可能长时间工作而不下线，即使系统出现一些小的问题也不会影响整个系统的正常运行，在某些情况下甚至可以进行 Hot Plug 的操作，替换有问题的组件，从而严格的确保系统的 downtime 时间在一定范围内。]]></description><category></category></item><item><title><![CDATA[DRAM Address Mapping/Decoding(内存地址解码)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/128205565</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/128205565</guid><author>u014689845</author><pubDate>Tue, 06 Dec 2022 16:59:17 +0800</pubDate><description><![CDATA[定义：所谓内存地址解码，也可以称作Dram地址的解码，DRAM Address Mapping(多通道卡槽定位和颗粒定位)解释：是指从64bit的内存物理地址(比如，0x12345678234)到Dram地址(socket/ctrl/chl/dimm/rank/chip/group/bank/row/col)的映射关系的过程。内存地址解码的过程是一个十分复杂的过程，对于intel平台来说，这部分MRC代码是BIOS在内存初始化阶段就执行完成的，我们作为UEFI应用开发者无法知晓这其中的具体实现过程，除非我们]]></description><category></category></item><item><title><![CDATA[英特尔确认Alder Lake CPU的UEFI BIOS源代码泄漏]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/128186781</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/128186781</guid><author>u014689845</author><pubDate>Mon, 05 Dec 2022 14:58:08 +0800</pubDate><description><![CDATA[英特尔确认Alder Lake CPU的UEFI BIOS源代码泄漏]]></description><category></category></item><item><title><![CDATA[UEFI Memory Type Description]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/121919950</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/121919950</guid><author>u014689845</author><pubDate>Tue, 14 Dec 2021 09:39:52 +0800</pubDate><description><![CDATA[EfiConventionalMemory: Available memory space

EfiLoaderCode: UEFI Application code

EfiLoaderData: UEFI Application data

EfiBootServicesCode: UEFI/PEI/DXE driver

EfiBootServicesData: UEFI/PEI/DXE driver allocated memory

EfiPersistentMemory

EfiRuntime.]]></description><category></category></item><item><title><![CDATA[NOTE2]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/121695163</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/121695163</guid><author>u014689845</author><pubDate>Fri, 03 Dec 2021 11:42:21 +0800</pubDate><description><![CDATA[INTEL VS AMD]]></description><category></category></item><item><title><![CDATA[DRAM学习---1]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/121636401</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/121636401</guid><author>u014689845</author><pubDate>Tue, 30 Nov 2021 16:32:14 +0800</pubDate><description><![CDATA[upgrading]]></description><category></category></item><item><title><![CDATA[ECC DIMM]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/120507681</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/120507681</guid><author>u014689845</author><pubDate>Mon, 27 Sep 2021 14:22:08 +0800</pubDate><description><![CDATA[内存RAM 分为三种 分别是non-ECC, unbuffered-ECC 和 registered ECC。 前两种为UDIMM ，后一种为RDIMM。 non-ECC是常见的普通消费类内存，也无缓存， unbuffered-ECC则是有ECC但是没有缓存寄存器的内存， registered ECC则是带缓存寄存器且带ECC的内存。

也就是说你要是用带ECC的 RAM 首先必须要CPU 支持。RDIMM 则需要主板和CPU都要提供支持才可以。 UDIMM中non-ECC和unbuffered的区别在于C]]></description><category></category></item><item><title><![CDATA[uefi shell  command]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/117228008</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/117228008</guid><author>u014689845</author><pubDate>Mon, 24 May 2021 17:29:18 +0800</pubDate><description><![CDATA[常用命令解释如下：

ver
			will show the shell version
			展示shell的版本号
		reconnect -r
			all EFI drivers should be reconnected
			重新连接EFI驱动
		alias
			all Alias should be displayed
			显示，创建，删除别名
		dmem
			memory contents are displayed
			显示内存目录
		connect
			some de.]]></description><category></category></item><item><title><![CDATA[Memory testing 11----Fuctional RAM Modle------Disturb Fault (DF)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/115492579</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/115492579</guid><author>u014689845</author><pubDate>Thu, 08 Apr 2021 08:26:19 +0800</pubDate><description><![CDATA[九、 干扰故障

如果干扰单元被读写，则被干扰单元会被置0或置1。







Disturb Fault (DF)

	Victim cell forced to 0 or 1 if we read or write aggressor cell (may be the same cell)
	



]]></description><category></category></item><item><title><![CDATA[Memory testing 10----Fuctional RAM Modle------Recovery Fault (RF)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/115492425</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/115492425</guid><author>u014689845</author><pubDate>Wed, 07 Apr 2021 18:27:40 +0800</pubDate><description><![CDATA[八、 恢复故障

 1、 感应放大器恢复故障：经过长时间的读写0或1后，感应放大器饱和；

 2、 写恢复故障：在不同位置的读写导致某个相同位置的读写；

 3、 功能性故障：以高速率进行检测测试。









Recovery Fault (RF)

	Sense Amplifier Recovery Fault (SARF)

		Sense amp saturation after reading/writing long run of 0 or 1
...]]></description><category></category></item><item><title><![CDATA[Memory testing 9----Fuctional RAM Modle------Stuck-Open Fault (SOF)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/115485320</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/115485320</guid><author>u014689845</author><pubDate>Wed, 07 Apr 2021 14:42:22 +0800</pubDate><description><![CDATA[七、开路故障：

由于断线的原因，存储单元无法被访问到。




	Stuck-Open Fault (SOF)：Cell not accessible due to open cell or broken line.
	
]]></description><category></category></item><item><title><![CDATA[Memory testing 8----Fuctional RAM Modle------Bridging Fault (BF)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/115483923</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/115483923</guid><author>u014689845</author><pubDate>Wed, 07 Apr 2021 14:18:48 +0800</pubDate><description><![CDATA[六、桥接故障：存储单元短路







Bridging Fault (BF)

	Short between cells
		AND type or OR type 
	




A short between cells or lines (2 or more)

This is a bidirectional fault caused by logic level rather than a transition

Two sorts of bridging faults (BFs) ex...]]></description><category></category></item><item><title><![CDATA[Memory testing 7----Fuctional RAM Modle------Neighborhood Pattern Sensitive Fault (NPSF)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/115482684</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/115482684</guid><author>u014689845</author><pubDate>Wed, 07 Apr 2021 12:25:56 +0800</pubDate><description><![CDATA[五、相邻图形敏感故障：

主动激发的动态型的故障、被动型的故障、静态型的故障。



Neighborhood Pattern Sensitive Fault (NPSF)：A subset of the Pattern Sensitive Fault (PSF)



Active (Dynamic) NPSF
	Passive NPSF
	Static NPSF







...]]></description><category></category></item><item><title><![CDATA[Memory testing 6------------Fuctional RAM Modle------------Coupling Fault (CF)]]></title><link>https://blog.youkuaiyun.com/u014689845/article/details/115482466</link><guid>https://blog.youkuaiyun.com/u014689845/article/details/115482466</guid><author>u014689845</author><pubDate>Wed, 07 Apr 2021 12:16:03 +0800</pubDate><description><![CDATA[四、 耦合故障

   4.1 状态耦合故障：当一个单元处于某个状态值时，另一个耦合单元被置0或1。

   4.2 翻转耦合故障：当一个单元发生上升沿跳变或下降沿跳变时，会引起另一个单元内容的翻转。

   4.3 幂耦合故障：当一个单元发生上升沿跳变或下降沿跳变时，会迫使另一个单元内容置0 或置1。

   4.4 动态耦合故障



1、State Coupling Fault (CFst)：Coupled (victim) cell is forced to 0 o...]]></description><category></category></item></channel></rss>