Memory testing 10----Fuctional RAM Modle------Recovery Fault (RF)

八、 恢复故障

       1、 感应放大器恢复故障：经过长时间的读写0或1后，感应放大器饱和；

       2、 写恢复故障：在不同位置的读写导致某个相同位置的读写；

       3、 功能性故障：以高速率进行检测测试。

 

 

 

 

• Recovery Fault (RF)
  • Sense Amplifier Recovery Fault (SARF)
    • Sense amp saturation after reading/writing long run of 0 or 1
  • Write Recovery Fault (WRF)
    • Write followed by reading/writing at different location resulting in reading/writing at same location
      • Write-after-write recovery fault
      • Read-after-write recovery fault
  • Results in functional faults---detected at high speed (e.g., GALROW/GALCOL)