US Department of Defense 5220.22-M

本文介绍美国国防部DoD5220.22-M标准中规定的多种清除和消毒介质的方法,包括消磁、覆写、破坏等过程,适用于不同级别的敏感信息处理。

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US Department of Defense 5220.22-M Clearing and Sanitization Matrix

a. Degauss with a Type I degausser

b. Degauss with a Type II degausser.

c. Overwrite all addressable locations with a single character.

d. Overwrite all addressable locations with a character, its complement, then a random character and verify. THIS METHOD IS NOT APPROVED FOR SANITIZING MEDIA THAT CONTAINS TOP SECRET INFORMATION.

e. Overwrite all addressable locations with a character, its complement, then a random character.

f. Each overwrite must reside in memory for a period longer than the classified data resided.

g. Remove all power to include battery power.

h. Overwrite all locations with a random pattern, all locations with binary zeros, all locations with binary ones.

i. Perform a full chip erase as per manufacturer's data sheets.

j. Perform i above, then c above, a total of three times.

k. Perform an ultraviolet erase according to manufacturer's recommendation.

l. Perform k above, but increase time by a factor of three.

m. Destroy - Disintegrate, incinerate, pulverize, shred, or melt.

n. Destruction required only if classified information is contained.

o. Run five pages of unclassified text (font test acceptable).

p. Ribbons must be destroyed. Platens must be cleaned.

q. Inspect and/or test screen surface for evidence of burned-in information. If present, the cathode ray tube must be destroyed.

For more information regarding clearing and sanitizing security standard DoD 5220.22-M see US Defence Security Service Web Site (Chapter 8).

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