recovery auto test cmd

本文详细介绍了一种通过ADB命令实现的OTA在线升级流程,包括推送更新文件到设备、更新文件的位置调整、更新命令的配置及重启进入恢复模式等步骤。此外,还提到了如何结合fastboot命令来进行完整的内置/外置SD卡和线刷版本的压力测试。

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adb wait-for-device
adb push update.zip  /sdcard/ota/update.zip
adb shell rm /sdcard/update.zip
adb shell cp /sdcard/ota/update.zip /data/media/0/update.zip
adb shell "echo \"/data/media/0/update.zip\" >> /cache/recovery/uncrypt_file " 
adb shell "echo \"--update_package=@/cache/recovery/block.map\" >> /cache/recovery/command" 
adb shell sync 
adb shell /system/bin/uncrypt   //about 7mins    

TIMEOUT /T 600 /NOBREAK  // 10 min
adb shell cat /cache/recovery/uncrypt_status  >= 100    ///  while

adb shell sync
TIMEOUT /T 60 /NOBREAK

adb reboot recovery 


配合fastboot命令,可进行完整包和差分包 在内置/外置SD 和线刷版本的同时自动压力测试。 

it is a good idea !

refer :

http://blog.youkuaiyun.com/miaotao/article/details/45129423

http://blog.youkuaiyun.com/miaotao/article/details/50174881

===== EEPROM Diagnostic Test ===== [TEST] Initializing EEPROM... [EEPROM] Initialized successfully. Status: 0x00 [TEST] SPI Mode: MODE0 [TEST] Write Enable Test: PASS (Status: 0x02) [TEST] Writing test pattern 0xA5 to address 0x0100... [TEST] Read value: 0xA5 from address 0x0100 [TEST] Single Byte Test: PASS [TEST] Writing 64-byte pattern... [TEST] Reading back 64-byte pattern... [TEST] Mismatch at offset 0: Wrote 0x00, Read 0x20 [TEST] Mismatch at offset 1: Wrote 0x01, Read 0x21 [TEST] Mismatch at offset 2: Wrote 0x02, Read 0x22 [TEST] Mismatch at offset 3: Wrote 0x03, Read 0x23 [TEST] Mismatch at offset 4: Wrote 0x04, Read 0x24 [TEST] Mismatch at offset 5: Wrote 0x05, Read 0x25 [TEST] Mismatch at offset 6: Wrote 0x06, Read 0x26 [TEST] Mismatch at offset 7: Wrote 0x07, Read 0x27 [TEST] Mismatch at offset 8: Wrote 0x08, Read 0x28 [TEST] Mismatch at offset 9: Wrote 0x09, Read 0x29 [TEST] Mismatch at offset 10: Wrote 0x0A, Read 0x2A [TEST] Mismatch at offset 11: Wrote 0x0B, Read 0x2B [TEST] Mismatch at offset 12: Wrote 0x0C, Read 0x2C [TEST] Mismatch at offset 13: Wrote 0x0D, Read 0x2D [TEST] Mismatch at offset 14: Wrote 0x0E, Read 0x2E [TEST] Mismatch at offset 15: Wrote 0x0F, Read 0x2F [TEST] Mismatch at offset 16: Wrote 0x10, Read 0x30 [TEST] Mismatch at offset 17: Wrote 0x11, Read 0x31 [TEST] Mismatch at offset 18: Wrote 0x12, Read 0x32 [TEST] Mismatch at offset 19: Wrote 0x13, Read 0x33 [TEST] Mismatch at offset 20: Wrote 0x14, Read 0x34 [TEST] Mismatch at offset 21: Wrote 0x15, Read 0x35 [TEST] Mismatch at offset 22: Wrote 0x16, Read 0x36 [TEST] Mismatch at offset 23: Wrote 0x17, Read 0x37 [TEST] Mismatch at offset 24: Wrote 0x18, Read 0x38 [TEST] Mismatch at offset 25: Wrote 0x19, Read 0x39 [TEST] Mismatch at offset 26: Wrote 0x1A, Read 0x3A [TEST] Mismatch at offset 27: Wrote 0x1B, Read 0x3B [TEST] Mismatch at offset 28: Wrote 0x1C, Read 0x3C [TEST] Mismatch at offset 29: Wrote 0x1D, Read 0x3D [TEST] Mismatch at offset 30: Wrote 0x1E, Read 0x3E [TEST] Mismatch at offset 31: Wrote 0x1F, Read 0x3F [TEST] Multi-byte Test: FAIL (32 errors) ===== Test Complete ===== EEPROM initialized. [EEPROM] Loaded calibration data: Offset: 1234597 Factor: 1.234500 Date: 20240515 Saved CRC: 0x818AC802, Calculated CRC: 0x10F506B7 [EEPROM] ERROR: CRC mismatch! No valid calibration data. Starting calibration... Saving test calibration data... [EEPROM] Saving calibration data: Offset: 1234567 Factor: 1.234500 Date: 20240515 CRC: 0x818AC802 [EEPROM] Loaded calibration data: Offset: 1234567 Factor: 1.234500 Date: 20240515 Saved CRC: 0x818AC802, Calculated CRC: 0x818AC802 [EEPROM] WARNING: Invalid factor: 1.234500
最新发布
08-21
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